Durable Test Connectors for ICT- and FCT test
The need of contacting standard USB or RJ connections and interfaces is increasing in the field of in-circuit and functional test of PCBs, because the standardization of these interfaces has great advantages.
Compared to using a normal USB or RJ45 plug a specific test contact has the advantage that it does not lock into the socket but creates a low-wear contact with a long life time of more than 100 000 test cycles. Additionally unwanted stress or damage of the contact springs within the test item can be avoided. The connection between the test contact and the test fixture or module is realized in a very simple way without soldering just by using the standard plug of the respective interface (plug and play). For maintenance purposes the exchange of the test contact is therefore very simple.
FEINMETALL test contacts are currently available for RJ-45, USB, Mini-USB und Micro-USB-Interfaces. They can be mounted into test fixtures or modules easily and effectively. The contacting of the DUT can be realized either by the vertical travel or the test fixture or by integrating the test contacts into a pneumatically controlled contacting unit.
With these new test contacts FEINMETALL extends the portfolio of contact probes for test engineering and offers even more comprehensive contacting solutions to its customers. Further test contacts are already projected and will be available soon.
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